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Semiconductor Laser Measurement System
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Summary

Semiconductor Laser is an important laser source, which is widely used in industrial and scientific research fields. Its spectral characteristics and power values are the most important performance indicators. Semiconductor Laser Measurement System provides all involved components such as light source driving, device installation, light sampling and conduction, spectral and optical power measurement.


During the test, the device is installed in the light source holder, then the light source holder is placed at the light entrance of the integrating sphere. The power is measured by the optical power meter installed on the integrating sphere with the driving current provided by the LDD controller, and the spectrometer is connected to the integrating sphere through the optical fiber for spectrum measurement.


Features
  • Optional spectral measurement range

  • Optional power measurement range

  • Customized laser mount

  • LDD Controller supports multiple modes


Applications

  • LD test and research

  • Single wavelength LED test

  • VCSEL test and research

  • Broadband light source spectrum test


Configuration

Item

Parameter

Spectrometer

Wavelength: 200~1700nm optional

Recommended BIM-6002A/BIM-6602A/BIM-68 series

Optical Power Meter

Wavelength: 200~1650nm optional

Recommend BIM-7101U/BIM-7102U/BIM-7103U series

Laser Mount

Package Type: TO-CAN/ patch

Integrating Sphere

Inner Diameter: 2 inches/100mm/150mm optional

Recommended SIM-3001 series

LDD Controller

Current/Voltage: 0~1.5 A/0~15 V

Working Mode: CW/Pulsed/analog input/external trigger/optical power control

Recommend BRM-6101

Optical Fiber

Wavelength Range: 200~1100nm/400~220nm

Recommended: SIM-6102/SIM-6103 series

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