Summary
Semiconductor Laser is an important laser source, which is widely used in industrial and scientific research fields. Its spectral characteristics and power values are the most important performance indicators. Semiconductor Laser Measurement System provides all involved components such as light source driving, device installation, light sampling and conduction, spectral and optical power measurement.
During the test, the device is installed in the light source holder, then the light source holder is placed at the light entrance of the integrating sphere. The power is measured by the optical power meter installed on the integrating sphere with the driving current provided by the LDD controller, and the spectrometer is connected to the integrating sphere through the optical fiber for spectrum measurement.
Optional spectral measurement range
Optional power measurement range
Customized laser mount
LDD Controller supports multiple modes
Applications
LD test and research
Single wavelength LED test
VCSEL test and research
Broadband light source spectrum test
Item | Parameter |
Spectrometer | Wavelength: 200~1700nm optional Recommended BIM-6002A/BIM-6602A/BIM-68 series |
Optical Power Meter | Wavelength: 200~1650nm optional Recommend BIM-7101U/BIM-7102U/BIM-7103U series |
Laser Mount | Package Type: TO-CAN/ patch |
Integrating Sphere | Inner Diameter: 2 inches/100mm/150mm optional Recommended SIM-3001 series |
LDD Controller | Current/Voltage: 0~1.5 A/0~15 V Working Mode: CW/Pulsed/analog input/external trigger/optical power control Recommend BRM-6101 |
Optical Fiber | Wavelength Range: 200~1100nm/400~220nm Recommended: SIM-6102/SIM-6103 series |